Issued Patents 2003
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6651204 | Modular architecture for memory testing on event based test system | Shigeru Sugamori, Hiroaki Yamoto | 2003-11-18 |
| 6629282 | Module based flexible semiconductor test system | Shigeru Sugamori | 2003-09-30 |
| 6594609 | Scan vector support for event based test system | Anthony Le | 2003-07-15 |
| 6578169 | Data failure memory compaction for semiconductor test system | Anthony Le, James Alan Turnquist, Shigeru Sugamori | 2003-06-10 |
| 6567941 | Event based test system storing pin calibration data in non-volatile memory | James Alan Turnquist, Shigeru Sugamori | 2003-05-20 |
| 6532561 | Event based semiconductor test system | James Alan Turnquist, Shigeru Sugamori, Hiroaki Yamoto | 2003-03-11 |