HY

Hiroaki Yamoto

AD Advantest: 3 patents #11 of 100Top 15%
🗺 California: #2,413 of 28,521 inventorsTop 9%
Overall (2003): #29,418 of 273,478Top 15%
3
Patents 2003

Issued Patents 2003

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6651204 Modular architecture for memory testing on event based test system Rochit Rajsuman, Shigeru Sugamori 2003-11-18
6631340 Application specific event based semiconductor memory test system Shigeru Sugamori, Koji Takahashi 2003-10-07
6532561 Event based semiconductor test system James Alan Turnquist, Shigeru Sugamori, Rochit Rajsuman 2003-03-11