MT

Michinobu Tanioka

NE Nec: 4 patents #46 of 1,934Top 3%
Overall (2002): #13,501 of 266,432Top 6%
4
Patents 2002

Issued Patents 2002

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
6486688 Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristics Toru Taura, Hirobumi Inoue, Takahiro Kimura, Kouji Matsunaga 2002-11-26
6433410 Semiconductor device tester and method of testing semiconductor device Takahiro Kimura, Hirobumi Inoue, Hiroo Ito, Yoshihito Fukasawa 2002-08-13
6426878 Bare chip carrier utilizing a pressing member Takahiro Kimura 2002-07-30
6396290 Test carrier and method of mounting semiconductor device thereon Takahiro Kimura 2002-05-28