Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6486688 | Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristics | Hirobumi Inoue, Michinobu Tanioka, Takahiro Kimura, Kouji Matsunaga | 2002-11-26 |
| 6400168 | Method for fabricating probe tip portion composed by coaxial cable | Kouji Matsunaga, Hirobumi Inoue, Masao Tanehashi, Masahiko Nikaidou, Yuuichi Yamagishi +1 more | 2002-06-04 |