Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6486688 | Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristics | Toru Taura, Michinobu Tanioka, Takahiro Kimura, Kouji Matsunaga | 2002-11-26 |
| 6433410 | Semiconductor device tester and method of testing semiconductor device | Michinobu Tanioka, Takahiro Kimura, Hiroo Ito, Yoshihito Fukasawa | 2002-08-13 |
| 6400168 | Method for fabricating probe tip portion composed by coaxial cable | Kouji Matsunaga, Masao Tanehashi, Toru Taura, Masahiko Nikaidou, Yuuichi Yamagishi +1 more | 2002-06-04 |