YF

Yoshihito Fukasawa

NE Nec: 2 patents #192 of 1,934Top 10%
📍 Tokyo, WA: #13 of 35 inventorsTop 40%
Overall (2002): #34,542 of 266,432Top 15%
2
Patents 2002

Issued Patents 2002

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6486686 Apparatus for testing a bare-chip LSI mounting on a printed board 2002-11-26
6433410 Semiconductor device tester and method of testing semiconductor device Michinobu Tanioka, Takahiro Kimura, Hirobumi Inoue, Hiroo Ito 2002-08-13