Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6433410 | Semiconductor device tester and method of testing semiconductor device | Michinobu Tanioka, Takahiro Kimura, Hirobumi Inoue, Yoshihito Fukasawa | 2002-08-13 |
| 6343365 | Large-scale integrated circuit and method for testing a board of same | Hajime Matsuzawa | 2002-01-29 |