Issued Patents 2002
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6495395 | Electrical and thermal contact for use in semiconductor devices | — | 2002-12-17 |
| 6492656 | Reduced mask chalcogenide memory | Russell C. Zahorik | 2002-12-10 |
| 6492243 | Methods of forming capacitors and resultant capacitor structures | — | 2002-12-10 |
| 6483171 | Vertical sub-micron CMOS transistors on (110), (111), (311), (511), and higher order surfaces of bulk, SOI and thin film structures and method of forming same | Leonard Forbes, Wendell P. Noble | 2002-11-19 |
| 6479379 | Self-aligned etch stop for polycrystalline silicon plugs on a semiconductor device | — | 2002-11-12 |
| 6461967 | Material removal method for forming a structure | Zhiqiang Wu, Li Li, Thomas A. Figura, Kunal R. Parekh, Pai-Hung Pan +1 more | 2002-10-08 |
| 6459138 | Capacitor structures | — | 2002-10-01 |
| 6456535 | Dynamic flash memory cells with ultra thin tunnel oxides | Leonard Forbes, Luan C. Tran, Joseph E. Geusic, Kie Y. Ahn, Paul A. Farrar +2 more | 2002-09-24 |
| 6444572 | Semiconductor processing methods of forming a contact opening | Zhiqiang Wu, Manny K. F. Ma | 2002-09-03 |
| 6432793 | Oxidative conditioning method for metal oxide layer and applications thereof | — | 2002-08-13 |
| 6429125 | Microelectronic device fabricating method | — | 2002-08-06 |
| 6414376 | Method and apparatus for reducing isolation stress in integrated circuits | Randhir P. S. Thakur, Kevin G. Donohoe, Zhiqiang Wu | 2002-07-02 |
| 6403442 | Methods of forming capacitors and resultant capacitor structures | — | 2002-06-11 |
| 6404669 | Reduced leakage DRAM storage unit | Zhigiang Wu, Randhir P. S. Thakur, Kirk D. Prall | 2002-06-11 |
| 6403493 | Microelectronic device fabricating methods | — | 2002-06-11 |
| 6355551 | Integrated circuit having a void between adjacent conductive lines | — | 2002-03-12 |
| 6356500 | Reduced power DRAM device and method | Eugene H. Cloud, Kie Y. Ahn, Leonard Forbes, Paul A. Farrar, Kevin G. Donohoe +3 more | 2002-03-12 |
| 6348125 | Removal of copper oxides from integrated interconnects | Joseph E. Geusic | 2002-02-19 |