Issued Patents 2002
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6489232 | ESD resistant device | Leslie Marchut, Franklin R. Nash | 2002-12-03 |
| 6490033 | Method of thin film process control and calibration standard for optical profilometry step height measurement | David Coult, Franklin Roy Dietz, Ranjani Muthiah, Sonja Radelow | 2002-12-03 |
| 6437868 | In-situ automated contactless thickness measurement for wafer thinning | David Coult, Duane Donald Wendling, Charles Lentz, Bryan P. Segner, Wan-ning Wu +1 more | 2002-08-20 |
| 6342442 | Kinetically controlled solder bonding | David L. Angst, David Coult, John W. Osenbach, Brian Stauffer Auker | 2002-01-29 |