Issued Patents 2002
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6486682 | Determination of dielectric constants of thin dielectric materials in a MOS (metal oxide semiconductor) stack | Nian Yang, Tien-Chun Yang | 2002-11-26 |
| 6472236 | Determination of effective oxide thickness of a plurality of dielectric materials in a MOS stack | Nian Yang, Tien-Chun Yang | 2002-10-29 |
| 6469939 | Flash memory device with increase of efficiency during an APDE (automatic program disturb after erase) process | Richard Fastow, Sheung-Hee Park, Sameer Haddad, Chi Chang | 2002-10-22 |
| 6461905 | Dummy gate process to reduce the Vss resistance of flash products | Hsiao-Han Thio, Nian Yang | 2002-10-08 |