Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6486682 | Determination of dielectric constants of thin dielectric materials in a MOS (metal oxide semiconductor) stack | Zhigang Wang, Nian Yang | 2002-11-26 |
| 6472236 | Determination of effective oxide thickness of a plurality of dielectric materials in a MOS stack | Zhigang Wang, Nian Yang | 2002-10-29 |