Issued Patents 2002
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6500713 | Method for repairing damage to charge trapping dielectric layer from bit line implantation | Mark T. Ramsbey, Arvind Halliyal | 2002-12-31 |
| 6455888 | Memory cell structure for elimination of oxynitride (ONO) etch residue and polysilicon stringers | Kathleen R. Early, Michael K. Templeton, Maria C. Chan | 2002-09-24 |
| 6420702 | Non-charging critical dimension SEM metrology standard | Bhanwar Singh, Michael K. Templeton | 2002-07-16 |
| 6410956 | Method and system for using a spacer to offset implant damage and reduce lateral diffusion in flash memory devices | Vei-Han Chan, Scott Luning, Mark Randolph, Daniel Sobek, Janet Wang +2 more | 2002-06-25 |
| 6355933 | Ion source and method for using same | Robert B. Ogle | 2002-03-12 |