Issued Patents 1997
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5703494 | Probing test apparatus | — | 1997-12-30 |
| 5665610 | Semiconductor device checking method | Yoshiro Nakata, Shinichi Oki, Koichi Nagao, Kenzo Hatada, Shigeoki Mori +1 more | 1997-09-09 |
| 5620610 | Catalyst for treating wastewater, process for producing it, and process for treating wastewater with the catalyst | Tohru Ishii, Kiichiro Mitsui, Keniti Shishida, Yusuke Shiota | 1997-04-15 |
| 5604446 | Probe apparatus | — | 1997-02-18 |