Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5665610 | Semiconductor device checking method | Shinichi Oki, Koichi Nagao, Kenzo Hatada, Shigeoki Mori, Takashi Sato +1 more | 1997-09-09 |
| 5605844 | Inspecting method for semiconductor devices | Shinichi Oki, Koichi Nagao | 1997-02-25 |