Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5665610 | Semiconductor device checking method | Yoshiro Nakata, Shinichi Oki, Koichi Nagao, Kenzo Hatada, Takashi Sato +1 more | 1997-09-09 |
| 5642432 | Probe device | — | 1997-06-24 |
SM
Shigeoki Mori
Tokyo Electron Limited: 1 patents #52 of 216Top 25%
Overall (1997): #24,252 of 185,788Top 15%
2
Patents 1997