Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5665610 | Semiconductor device checking method | Yoshiro Nakata, Shinichi Oki, Koichi Nagao, Shigeoki Mori, Takashi Sato +1 more | 1997-09-09 |
| 5640044 | Semiconductor device and method of producing said semiconductor device | Shinitsu Takehashi | 1997-06-17 |