Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5594245 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada +3 more | 1997-01-14 |
| 5594246 | Method and apparatus for x-ray analyses | Yoshimi Sudo, Tokuo Kure, Katsuhiro Kuroda, Takashi Nishida, Hideo Todokoro +2 more | 1997-01-14 |