Issued Patents 1997
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5640539 | IC analysis system having charged particle beam apparatus for improved contrast image | Akira Goishi, Masayuki Kurihara | 1997-06-17 |
| 5633595 | IC analysis system and electron beam probe system and fault isolation method therefor | Akira Goishi, Masayuki Kuribara | 1997-05-27 |
| 5592099 | IC tester joined with ion beam tester and the detection method of the failure part of IC | Masayuki Kuribara, Akira Goishi | 1997-01-07 |