Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5633595 | IC analysis system and electron beam probe system and fault isolation method therefor | Koshi Ueda, Akira Goishi | 1997-05-27 |
| 5592099 | IC tester joined with ion beam tester and the detection method of the failure part of IC | Akira Goishi, Koshi Ueda | 1997-01-07 |