GS

Gurtej S. Sandhu

Micron: 2 patents #38 of 158Top 25%
📍 Boise, ID: #25 of 164 inventorsTop 20%
🗺 Idaho: #44 of 378 inventorsTop 15%
Overall (1994): #32,999 of 165,921Top 20%
2
Patents 1994

Issued Patents 1994

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
5326428 Method for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability Warren M. Farnworth, Malcolm Grief 1994-07-05
5314843 Integrated circuit polishing method Chris C. Yu, Trung T. Doan 1994-05-24