Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5366906 | Wafer level integration and testing | Robert J. Wojnarowski, Constantine A. Neugebauer, Wolfgang Daum, Bernard Gorowitz, Michael Gdula +2 more | 1994-11-22 |
| 5353498 | Method for fabricating an integrated circuit module | Raymond Albert Fillion, Robert J. Wojnarowski, Michael Gdula, Herbert S. Cole, Jr., Wolfgang Daum | 1994-10-11 |