Issued Patents All Time
Showing 51–67 of 67 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8995571 | Baseband digital pre-distortion architecture | — | 2015-03-31 |
| 8987055 | Method for packaging low-K chip | Li Zhang, Zhiming Lai, Jinhui Chen | 2015-03-24 |
| 8899702 | Latch mechanism, electronic apparatus having the same, and method for removing a shell cover from a shell base using the same | Zhong-Hui Mao, Zhang Jin, Hung-Ming Chang | 2014-12-02 |
| 8794984 | Protective structure for covering a connector and electronic device therewith | Zhong-Hui Mao | 2014-08-05 |
| 8672598 | Screw post | Zhong-Hui Mao | 2014-03-18 |
| 8087628 | Fixing mechanism for fixing a display and related displaying device | Hung-Chang W. Huang | 2012-01-03 |
| 8020821 | Wall hanger and assembly of the wall hanger and a computer device | Hung-Chang W. Huang | 2011-09-20 |
| 7956630 | Real-time effective-wavelength error correction for HDVSI | — | 2011-06-07 |
| 7898672 | Real-time scanner-nonlinearity error correction for HDVSI | — | 2011-03-01 |
| 7864327 | In-phase/in-quadrature demodulator for spectral information of interference signal | — | 2011-01-04 |
| 7808652 | Interferometric measurement of DLC layer on magnetic head | Florin Munteanu, Erik Novak, G. Lawrence Best | 2010-10-05 |
| 7605925 | High-definition vertical-scan interferometry | — | 2009-10-20 |
| 7547882 | Scan data collection for better overall data accurancy | Kenneth Gilbert Roessler | 2009-06-16 |
| 7385405 | Capacitance probe for thin dielectric film characterization | — | 2008-06-10 |
| 7053369 | Scan data collection for better overall data accuracy | Kenneth Gilbert Roessler | 2006-05-30 |
| 7008540 | Ultrasonically cleaned membrane filtration system | Linda Kay Weavers, Harold W. Walker, Mikko O. Lamminen | 2006-03-07 |
| 7001785 | Capacitance probe for thin dielectric film characterization | — | 2006-02-21 |