Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9752868 | Optical measurement of lead angle of groove in manufactured part | Florin Munteanu | 2017-09-05 |
| 9664501 | Automated re-focusing of interferometric reference mirror | Colin Farrell, Bryan Guenther | 2017-05-30 |
| 9664509 | Signal sectioning for profiling printed-circuit-bord vias with vertical scanning interferometry | Joanna Schmit | 2017-05-30 |
| 9234814 | Automated re-focusing of interferometric reference mirror | Colin Farrell, Bryan Guenther | 2016-01-12 |
| 8953171 | Signal sectioning for profiling printed-circuit-board vias with vertical scanning interferometry | Joanna Schmit | 2015-02-10 |
| 8482741 | Interferometric measurement of non-homogeneous multi-material surfaces | Dong Chen, Florin Munteanu, G. Lawrence Best | 2013-07-09 |
| 8416425 | Interferometric measurement of non-homogeneous multi-material surfaces | Florin Munteanu, Dong Chen, G. Lawrence Best | 2013-04-09 |
| 8213021 | Interferometric measurement of non-homogeneous multi-material surfaces | Dong Chen, Florin Munteanu, G. Lawrence Best | 2012-07-03 |
| 7808652 | Interferometric measurement of DLC layer on magnetic head | Florin Munteanu, Dong Chen, G. Lawrence Best | 2010-10-05 |
| 7654685 | Variable-wavelength illumination system for interferometry | Der-Shen Wan, Colin Farrell | 2010-02-02 |
| 7283250 | Measurement of object deformation with optical profiler | Joanna Schmit, Paul R. Unruh | 2007-10-16 |
| 7212356 | Mounting mechanism for compensating optics in interferometer | Bryan Guenther | 2007-05-01 |
| 7119909 | Film thickness and boundary characterization by interferometric profilometry | Paul R. Unruh, Joanna Schmit | 2006-10-10 |
| 5633715 | Centroid approach for estimating modulation peak in broad-bandwidth interferometry | Chiayu Ai | 1997-05-27 |