Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7283250 | Measurement of object deformation with optical profiler | Joanna Schmit, Erik Novak | 2007-10-16 |
| 7119909 | Film thickness and boundary characterization by interferometric profilometry | Joanna Schmit, Erik Novak | 2006-10-10 |
| 6552806 | Automated minimization of optical path difference and reference mirror focus in white-light interference microscope objective | Richard Swinford, David J. Aziz, Bryan Guenther | 2003-04-22 |
| 5726754 | Variable-speed scanning for interferometric measurements | Michael Andrews | 1998-03-10 |