FM

Florin Munteanu

BN Bruker Nano: 5 patents #21 of 148Top 15%
VI Veeco Instruments: 2 patents #99 of 323Top 35%
Overall (All Time): #643,747 of 4,157,543Top 20%
8
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9752868 Optical measurement of lead angle of groove in manufactured part Erik Novak 2017-09-05
9282304 Full-color images produced by white-light interferometry Joanna Schmit 2016-03-08
8482741 Interferometric measurement of non-homogeneous multi-material surfaces Dong Chen, Erik Novak, G. Lawrence Best 2013-07-09
8416425 Interferometric measurement of non-homogeneous multi-material surfaces Dong Chen, Erik Novak, G. Lawrence Best 2013-04-09
8275573 Large-surface defect detection by single-frame spatial-carrier interferometry Joanna Schmit 2012-09-25
8213021 Interferometric measurement of non-homogeneous multi-material surfaces Dong Chen, Erik Novak, G. Lawrence Best 2012-07-03
7808652 Interferometric measurement of DLC layer on magnetic head Dong Chen, Erik Novak, G. Lawrence Best 2010-10-05
7505863 Interferometric iterative technique with bandwidth and numerical-aperture dependency Joanna Schmit 2009-03-17