Issued Patents All Time
Showing 26–42 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5825038 | Large area uniform ion beam formation | Julian G. Blake, Adam Brailove, Peter Rose, Barbara J. Hughey | 1998-10-20 |
| 5719403 | MeV scanning ions implanter | — | 1998-02-17 |
| 5693939 | MeV neutral beam ion implanter | — | 1997-12-02 |
| 5661299 | Miniature AMS detector for ultrasensitive detection of individual carbon-14 and tritium atoms | — | 1997-08-26 |
| 5621209 | Attomole detector | — | 1997-04-15 |
| 5569915 | Sensitive mass spectroscopy using molecular fragmentation | Linas R. Kilius, Albert E. Litherland, John C. Rucklidge, Xiaolei Zhao | 1996-10-29 |
| 5438194 | Ultra-sensitive molecular identifier | Reijer Koudijs, Marcel M. Mulder, Frans W. Saris | 1995-08-01 |
| 5391870 | High-speed precision mass selection system | — | 1995-02-21 |
| 5247263 | Injection system for tandem accelerators | — | 1993-09-21 |
| 5237174 | Single atom detection of chlorine-36 by triple-stage accelerator mass spectrometry | — | 1993-08-17 |
| 5120956 | Acceleration apparatus which reduced backgrounds of accelerator mass spectrometry measurements of .sup.14 C and other radionuclides | — | 1992-06-09 |
| 5118936 | Accuracy of AMS isotopic ratio measurements | — | 1992-06-02 |
| 4973841 | Precision ultra-sensitive trace detector for carbon-14 when it is at concentration close to that present in recent organic materials | — | 1990-11-27 |
| 4967078 | Rutherford backscattering surface analyzer with 180-degree deflecting and focusing permanent magnet | — | 1990-10-30 |
| 4775796 | Treating workpieces with beams | Norman L. Turner | 1988-10-04 |
| 4616157 | Injector for negative ions | Harry E. Naylor | 1986-10-07 |
| 4553069 | Wafer holding apparatus for ion implantation | — | 1985-11-12 |