Philippe Gastaldo — 17 Patents at Unity Semiconductor

Philippe Gastaldo has been granted 17 US patents while listed as an inventor at Unity Semiconductor. The first was granted in 2010 and the most recent in April 2024. Philippe Gastaldo ranks #263,971 of 4,157,543 US inventors in our database (top 6.3%). Patent records list Philippe Gastaldo in Chambéry, FR.

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #	Title	Co-Inventors	Date
11965730	Method for measuring film thickness distribution of wafer with thin films	Susumu Kuwabara, Kevin Quinquinet	2024-04-23
11092644	Method and system for inspecting boards for microelectronics or optics by laser doppler effect	Mayeul Durand de Gevigney, Tristan Combier	2021-08-17
11005418	Device for testing a concentrated photovoltaic module	—	2021-05-11
10432140	Method for testing a concentrated photovoltaic module	Remi Blanchard	2019-10-01
10260868	Interferometric method and system using variable fringe spacing for inspecting transparent wafers for electronics, optics or optoelectronics	Mayeul Durand de Gevigney	2019-04-16
10240977	Method for 2D/3D inspection of an object such as a wafer	Gilles Fresquet, Alain Courteville	2019-03-26
10082425	Integrated chromatic confocal sensor	—	2018-09-25
9859842	Device and method for testing a concentrated photovoltaic module	Mathieu Guilhem	2018-01-02
9857313	Method and system for inspecting wafers for electronics, optics or optoelectronics	Mayeul Durand de Gevigney	2018-01-02
9816942	Device and method for inspecting semiconductor materials	Viviane Leguy	2017-11-14
9739600	Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer	Gilles Fresquet, Alain Courteville	2017-08-22
9494529	Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer with variable spatial resolution	Gilles Fresquet, Alain Courteville	2016-11-15
9389189	Dark-field semiconductor wafer inspection device	Frederic Pernot	2016-07-12
9007456	Device and method for inspecting semiconductor wafers	François Berger, Cleonisse Serrecchia	2015-04-14
8817249	Device and method for inspecting moving semiconductor wafers	Frederic Pernot, Olivier Piffard	2014-08-26
8654324	Device and method for inspecting semiconductor wafers	—	2014-02-18
7812942	Method for detecting surface defects on a substrate and device using said method	Cécile MOULIN, Sophie Moritz, François Berger, Jean-Luc Delcarri, Patrice Belin +1 more	2010-10-12

Philippe Gastaldo — 17 Patents

Issued Patents All Time

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