Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11965730 | Method for measuring film thickness distribution of wafer with thin films | Susumu Kuwabara, Kevin Quinquinet | 2024-04-23 |
| 11092644 | Method and system for inspecting boards for microelectronics or optics by laser doppler effect | Mayeul Durand de Gevigney, Tristan Combier | 2021-08-17 |
| 11005418 | Device for testing a concentrated photovoltaic module | — | 2021-05-11 |
| 10432140 | Method for testing a concentrated photovoltaic module | Remi Blanchard | 2019-10-01 |
| 10260868 | Interferometric method and system using variable fringe spacing for inspecting transparent wafers for electronics, optics or optoelectronics | Mayeul Durand de Gevigney | 2019-04-16 |
| 10240977 | Method for 2D/3D inspection of an object such as a wafer | Gilles Fresquet, Alain Courteville | 2019-03-26 |
| 10082425 | Integrated chromatic confocal sensor | — | 2018-09-25 |
| 9859842 | Device and method for testing a concentrated photovoltaic module | Mathieu Guilhem | 2018-01-02 |
| 9857313 | Method and system for inspecting wafers for electronics, optics or optoelectronics | Mayeul Durand de Gevigney | 2018-01-02 |
| 9816942 | Device and method for inspecting semiconductor materials | Viviane Leguy | 2017-11-14 |
| 9739600 | Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer | Gilles Fresquet, Alain Courteville | 2017-08-22 |
| 9494529 | Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer with variable spatial resolution | Gilles Fresquet, Alain Courteville | 2016-11-15 |
| 9389189 | Dark-field semiconductor wafer inspection device | Frederic Pernot | 2016-07-12 |
| 9007456 | Device and method for inspecting semiconductor wafers | François Berger, Cleonisse Serrecchia | 2015-04-14 |
| 8817249 | Device and method for inspecting moving semiconductor wafers | Frederic Pernot, Olivier Piffard | 2014-08-26 |
| 8654324 | Device and method for inspecting semiconductor wafers | — | 2014-02-18 |
| 7812942 | Method for detecting surface defects on a substrate and device using said method | Cécile MOULIN, Sophie Moritz, François Berger, Jean-Luc Delcarri, Patrice Belin +1 more | 2010-10-12 |