Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12163899 | System for optical inspection of a substrate using same or different wavelengths | Guillaume Vienne, Kaiss Benhadjsalem | 2024-12-10 |
| 12074400 | Substrate dimension adapter | Yueh Sheng Ow, Christophe Isnard | 2024-08-27 |
| 11965834 | Dark-field optical inspection device | — | 2024-04-23 |
| 11300520 | Method and system for optically inspecting a substrate | — | 2022-04-12 |
| 11092644 | Method and system for inspecting boards for microelectronics or optics by laser doppler effect | Philippe Gastaldo, Tristan Combier | 2021-08-17 |
| 10260868 | Interferometric method and system using variable fringe spacing for inspecting transparent wafers for electronics, optics or optoelectronics | Philippe Gastaldo | 2019-04-16 |
| 9857313 | Method and system for inspecting wafers for electronics, optics or optoelectronics | Philippe Gastaldo | 2018-01-02 |