Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12359910 | Device and method for measuring interfaces of an optical element | Sylvain PETITGRAND | 2025-07-15 |
| 12163777 | Device and method for imaging and interferometry measurements | Gilles Fresquet | 2024-12-10 |
| 12123698 | Method and a system for characterizing structures through a substrate | Michael Schöbitz, Wolfgang Alexander Iff | 2024-10-22 |
| 12079979 | Method and a system for characterising structures through a substrate | Wolfgang Alexander Iff | 2024-09-03 |
| 11808656 | Device and method for measuring interfaces of an optical element | Charankumar Godavarthi | 2023-11-07 |
| 11731285 | Apparatus provided with a capacitive detection and electric line(s) in the capacitive detection zone | Yacine CHAKOUR, Didier Roziere | 2023-08-22 |
| 11226188 | Low-coherence reflectometry method and device employing time-frequency detection | Christian Neel, Charankumar Godavarthi | 2022-01-18 |
| 10919157 | Multi-distance detection device for a robot, and robot equipped with such (a) device(s) | Didier Roziere | 2021-02-16 |
| 10240977 | Method for 2D/3D inspection of an object such as a wafer | Gilles Fresquet, Philippe Gastaldo | 2019-03-26 |
| 9739600 | Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer | Gilles Fresquet, Philippe Gastaldo | 2017-08-22 |
| 9494529 | Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer with variable spatial resolution | Gilles Fresquet, Philippe Gastaldo | 2016-11-15 |
| 7782468 | Method and device for measuring heights of patterns | — | 2010-08-24 |