Issued Patents All Time
Showing 26–50 of 137 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10418290 | Method of patterning semiconductor device | Hon-Huei Liu, Chia-Hung Lin, Yu-Cheng Tung | 2019-09-17 |
| 10395999 | Method for monitoring fin removal | Cheng-Hao Yang, Hsiao-Lin Hsu, Tang-Chun Weng, Chia-Ching Lin, Yen-Pu Chen | 2019-08-27 |
| 10396171 | Semiconductor structure and manufacturing method thereof | Yu-Cheng Tung, Rung-Yuan Lee, Chih-Wei Yang | 2019-08-27 |
| 10373827 | Method of pattern transfer | Yu-Cheng Tung | 2019-08-06 |
| 10373915 | Method for monitoring semiconductor process | Hsiao-Lin Hsu, Yi-Ting Chen, Sho-Shen Lee | 2019-08-06 |
| 10347716 | Method for fabricating shallow trench isolation between fin-shaped structures | Chih-Wei Yang, Yu-Cheng Tung, Chun-Yuan Wu | 2019-07-09 |
| 10340381 | Method for fabricating semiconductor structure | Yu-Cheng Tung | 2019-07-02 |
| 10332877 | Semiconductor device and manufacturing method thereof | Yu-Cheng Tung, Chih-Wei Yang | 2019-06-25 |
| 10319597 | Semiconductor device with particular fin-shaped structures and fabrication method thereof | Yu-Cheng Tung | 2019-06-11 |
| 10319641 | Semiconductor device having gate structure | Chao-Hung Lin, Yu-Cheng Tung | 2019-06-11 |
| 10319856 | Semiconductor device | Yu-Cheng Tung | 2019-06-11 |
| 10312353 | Semiconductor device and method for fabricating the same | Yu-Cheng Tung | 2019-06-04 |
| 10290551 | Overlay mark and method for evaluating stability of semiconductor manufacturing process | Yu-Cheng Tung | 2019-05-14 |
| 10283616 | Fabricating method of semiconductor structure | Wen-Chien Hsieh, Chih-Wei Yang, Yu-Cheng Tung, Po-Wen Su | 2019-05-07 |
| 10283413 | Semiconductor device and manufacturing method thereof | Yu-Cheng Tung, Chih-Wei Yang | 2019-05-07 |
| 10205005 | Semiconductor device and method for fabricating the same | Yu-Cheng Tung | 2019-02-12 |
| 10203596 | Method of filtering overlay data by field | Che-Yi Lin | 2019-02-12 |
| 10204981 | Semiconductor structure and manufacturing method thereof | Yu-Cheng Tung, Ching-Ling Lin | 2019-02-12 |
| 10177094 | Measurement mark and method for monitoring semiconductor process | Hsiao-Lin Hsu, Yi-Ting Chen, Sho-Shen Lee | 2019-01-08 |
| 10170623 | Method of fabricating semiconductor device | Tang-Chun Weng, Chien-Hao Chen | 2019-01-01 |
| 10170369 | Semiconductor device and fabrication method thereof | Hsiao-Lin Hsu | 2019-01-01 |
| 10164039 | Semiconductor device having metal gate | Chih-Wei Yang, Yu-Cheng Tung | 2018-12-25 |
| 10163659 | Fin-type field effect transistor and method of forming the same | Yu-Cheng Tung | 2018-12-25 |
| 10153353 | Semiconductor structure | Yu-Cheng Tung, Rung-Yuan Lee, Chih-Wei Yang | 2018-12-11 |
| 10153369 | Semiconductor structure with inverted U-shaped cap layer | Yu-Cheng Tung | 2018-12-11 |