Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9426461 | Method for binarizing intra prediction mode and method, apparatus, and system for decoding intra prediction mode | Jiali Fu, Haitao Yang, Jingjing Dai | 2016-08-23 |
| 9377286 | Device for globally measuring thickness of metal film | Xinchun Lu, Dewen Zhao, Qian Zhao, Yongyong He, Yonggang Meng | 2016-06-28 |