Issued Patents All Time
Showing 26–28 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7595869 | Optical metrology system optimized with a plurality of design goals | Manuel Madriaga, Ching-Ling Meng, Mihail Mihaylov | 2009-09-29 |
| 7589845 | Process control using an optical metrology system optimized with signal criteria | Manuel Madriaga, Ching-Ling Meng, Mihail Mihalov | 2009-09-15 |
| 7538868 | Pattern recognition matching for bright field imaging of low contrast semiconductor devices | Wei Shen, Byeong Su Hwang, Tuan Van Tran | 2009-05-26 |