Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11340263 | Probe device and method of adjusting the same | — | 2022-05-24 |
| 11221363 | Test device, test method, and memory medium | — | 2022-01-11 |
| 10310010 | Probe apparatus and probe method | Shinji Akaike, Kenta Saiki, Kazuhiko Koshimizu, Isao Okazaki, Mitsuya Kawatsuki +1 more | 2019-06-04 |
| 10006941 | Position accuracy inspecting method, position accuracy inspecting apparatus, and position inspecting unit | Kenta Saiki, Toshihiko Tanaka, Kazuhiko Koshimizu, Shinji Akaike | 2018-06-26 |