Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10310010 | Probe apparatus and probe method | Muneaki Tamura, Shinji Akaike, Kenta Saiki, Isao Okazaki, Mitsuya Kawatsuki +1 more | 2019-06-04 |
| 10006941 | Position accuracy inspecting method, position accuracy inspecting apparatus, and position inspecting unit | Kenta Saiki, Toshihiko Tanaka, Muneaki Tamura, Shinji Akaike | 2018-06-26 |