Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7783669 | Data flow management in generating profile models used in optical metrology | Hong Qiu, Junwei Bao, Wei Liu, Jeffrey A. Chard, Miao Liu +2 more | 2010-08-24 |
| 7765076 | Allocating processing units to processing clusters to generate simulated diffraction signals | Hong Qiu, Junwei Bao, Vi Vuong | 2010-07-27 |
| 7765234 | Data flow management in generating different signal formats used in optical metrology | Hong Qiu, Junwei Bao, Wei Liu, Jeffrey A. Chard, Miao Liu +2 more | 2010-07-27 |
| 7742888 | Allocating processing units to generate simulated diffraction signals used in optical metrology | Hong Qiu, Junwei Bao, Vi Vuong | 2010-06-22 |