Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9535010 | Defect sampling for electron beam review based on defect attributes from optical inspection and optical review | Rohan Gosain | 2017-01-03 |
| 7189615 | Single mask MIM capacitor and resistor with in trench copper drift barrier | Satyavolu Srinivas Papa Rao, Darius Crenshaw, Stephan Grunow, Kenneth D. Brennan, Montray Leavy +3 more | 2007-03-13 |
| 6686283 | Shallow trench isolation planarization using self aligned isotropic etch | Shawn T. Walsh, John E. Campbell, James B. Friedmann, Michael J. McGranaghan, Janice D. Makos +8 more | 2004-02-03 |