Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9003260 | Partial-writes to ECC (error check code) enabled memories | Saya Goud Langadi | 2015-04-07 |
| 8799713 | Interruptible non-destructive run-time built-in self-test for field testing | Swathi Gangasani, Srinivasulu Alampally, Prohor Chowdhury, Srinivasa Chakravarthy, Rubin Ajit Parekhji | 2014-08-05 |
| 8473797 | Circuits and methods for clock malfunction detection | Chirag Gupta, Saya Goud Langadi | 2013-06-25 |