Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9797948 | Scan-based MCM interconnect testing | Milan Shetty, Prasanth V | 2017-10-24 |
| 9140754 | Scan-based MCM interconnecting testing | Milan Shetty, V. Prasanth | 2015-09-22 |
| 8799713 | Interruptible non-destructive run-time built-in self-test for field testing | Swathi Gangasani, Prohor Chowdhury, Srinivasa Chakravarthy, Padmini Sampath, Rubin Ajit Parekhji | 2014-08-05 |
| 8286042 | On-chip seed generation using boolean functions for LFSR re-seeding based logic BIST techniques for low cost field testability | Swathi Gangasani, Divya Divakaran, Rubin Ajit Parekhji, Amit Kumar Dutta, Srivaths Ravi | 2012-10-09 |