Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9006001 | Simple scatterometry structure for Si recess etch control | Vladimir A. Ukraintsev | 2015-04-14 |
| 7514309 | Methods to selectively protect NMOS regions, PMOS regions, and gate layers during EPI process | Seetharaman Sridhar, Che-Jen Hu, Antonio Luis Pacheco Rotondaro | 2009-04-07 |