| 7161866 |
Memory device tester and method for testing reduced power states |
Matthew R. Harrington, Van Huynh |
2007-01-09 |
| 6914843 |
Memory device tester and method for testing reduced power states |
Matthew R. Harrington, Van Huynh |
2005-07-05 |
| 6775192 |
Memory device tester and method for testing reduced power states |
Matthew R. Harrington, Van Huynh |
2004-08-10 |
| 6674677 |
Memory device tester and method for testing reduced power states |
Matthew R. Harrington, Van Huynh |
2004-01-06 |
| 6418070 |
Memory device tester and method for testing reduced power states |
Matthew R. Harrington, Van Huynh |
2002-07-09 |
| 6373127 |
Integrated capacitor on the back of a chip |
Daniel Baudouin, Akitoshi Nishimura, Jeffrey W. Janzen, Mark A. Kressley |
2002-04-16 |
| 6028800 |
Sense amplifier driver having variable power-supply voltage |
Takesada Akiba, Goro Kitsukawa, Hiroshi Otori, Masayuki Nakamura, Hideo Sunami |
2000-02-22 |
| 5793694 |
Semiconductor integrated circuit device having means for peak current reduction |
Takesada Akiba, Hiroshi Otori, Masayuki Nakamura |
1998-08-11 |
| 5343433 |
CMOS sense amplifier |
Charvaka Duvvury |
1994-08-30 |
| 5321510 |
Serial video processor |
Jimmie D. Childers |
1994-06-14 |
| 5309446 |
Test validation method for a semiconductor memory device |
Danny R. Cline, Wah Kit Loh, Hugh P. McAdams, Chok Y. Hung |
1994-05-03 |
| RE34026 |
CMOS sense amplifier with N-channel sensing |
Charvaka Duvvury |
1992-08-11 |
| 5127739 |
CMOS sense amplifier with bit line isolation |
Charvaka Duvvury |
1992-07-07 |
| 4627033 |
Sense amplifier with reduced instantaneous power |
Charvaka Duvvury |
1986-12-02 |
| 4608670 |
CMOS sense amplifier with N-channel sensing |
Charvaka Duvvury |
1986-08-26 |
| 4547868 |
Dummy-cell circuitry for dynamic read/write memory |
Jimmie D. Childers |
1985-10-15 |
