Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
VH

Van Huynh — 8 Patents

Micron: 5 patents #2,538 of 6,374Top 40%
IBM: 3 patents #26,335 of 70,183Top 40%
Houston, TX: #2,918 of 21,073 inventorsTop 15%
Texas: #19,067 of 125,132 inventorsTop 20%
Overall (All Time): #600,572 of 4,157,543Top 15%
8 Patents All Time
Van Huynh has been granted 8 US patents while listed as an inventor at Micron. The first was granted in 2002 and the most recent in August 2021. Van Huynh ranks #600,572 of 4,157,543 US inventors in our database (top 14.4%). Patent records list Van Huynh in Houston, TX, US.

Patents per Year

Patents granted per year, 2002 to 2021Bar chart with a peak of 2 patents in 2004.peak 22002: 1 patents20022004: 2 patents20042005: 1 patents20052007: 1 patents20072019: 1 patents20192020: 1 patents20202021: 1 patents2021

Issued Patents All Time

Showing 1–8 of 8 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
11086565 Reducing effects of read array operations of read apparent voltage Kevin E. Sallese, Timothy J. Fisher, Adalberto G. Yanes, Jason Ma, Charles A. Keller +2 more 2021-08-10 $4,960,000
10770155 Determining a read apparent voltage infector page and infected page Timothy J. Fisher, Aaron D. Fry, Charles A. Keller, Jason Ma, Kevin E. Sallese +1 more 2020-09-08 $3,136,000
10489086 Reducing read errors by performing mitigation reads to blocks of non-volatile memory Adalberto G. Yanes, Timothy J. Fisher, Charles A. Keller, Jason Ma, Kevin E. Sallese +2 more 2019-11-26 $3,625,000
7161866 Memory device tester and method for testing reduced power states Matthew R. Harrington, Adin E. Hyslop 2007-01-09 $1,984,000
6914843 Memory device tester and method for testing reduced power states Matthew R. Harrington, Adin E. Hyslop 2005-07-05 $1,616,000
6775192 Memory device tester and method for testing reduced power states Matthew R. Harrington, Adin E. Hyslop 2004-08-10 $1,379,000
6674677 Memory device tester and method for testing reduced power states Matthew R. Harrington, Adin E. Hyslop 2004-01-06 $2,966,000
6418070 Memory device tester and method for testing reduced power states Matthew R. Harrington, Adin E. Hyslop 2002-07-09 $4,358,000