| 12176177 |
Ion beam chamber fluid delivery apparatus and method and ion beam etcher using same |
Alexander Sorkin, Trevor Jason French, Ian Jones, Paul L. Gagnon |
2024-12-24 |
| 12165840 |
Ion beam delayering system and method, topographically enhanced delayered sample produced thereby, and imaging methods and systems related thereto |
Alexander Sorkin |
2024-12-10 |
| 11214874 |
Method and system for ion beam delayering of a sample and control thereof |
Robert K. Foster, Jason Abt, Ian Jones, Heinz Josef Nentwich |
2022-01-04 |
| 10689763 |
Method and system for ion beam delayering of a sample and control thereof |
Robert K. Foster, Jason Abt, Ian Jones, Heinz Josef Nentwich |
2020-06-23 |
| 10550480 |
Method and system for ion beam delayering of a sample and control thereof |
Robert K. Foster, Jason Abt, Ian Jones, Heinz Josef Nentwich |
2020-02-04 |
| 10469777 |
Methods, systems and devices relating to distortion correction in imaging devices |
Alexander Sorkin, Vladimir Martincevic |
2019-11-05 |
| 9915628 |
Circuit tracing using a focused ion beam |
Alexander Sorkin, Michael William Phaneuf, Alexander Krechmer, Ken Guillaume Lagarec |
2018-03-13 |
| 9534299 |
Method and system for ion beam delayering of a sample and control thereof |
Robert K. Foster, Jason Abt, Ian Jones, Heinz Josef Nentwich |
2017-01-03 |
| 9529040 |
Circuit tracing using a focused ion beam |
Alexander Sorkin, Alexander Krechmer |
2016-12-27 |