Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12288664 | Particle beam device having a deflection unit | Dirk Preikszas | 2025-04-29 |
| 12255044 | Fiducial guided cross-sectioning and lamella preparation with tomographic data collection | Ken Guillaume Lagarec | 2025-03-18 |
| 12007344 | Method for cross-section sample preparation | Ken Guillaume Lagarec, Andrew John Murray | 2024-06-11 |
| RE50001 | Method and system for cross-sectioning a sample with a preset thickness or to a target site | Ken Guillaume Lagarec | 2024-06-04 |
| 11923168 | Microscopy imaging method for 3D tomography with predictive drift tracking for multiple charged particle beams | Ken Guillaume Lagarec | 2024-03-05 |
| 11726050 | Method for cross-section sample preparation | Ken Guillaume Lagarec, Andrew John Murray | 2023-08-15 |
| 11462383 | Method and system for iteratively cross-sectioning a sample to correlatively targeted sites | Ken Guillaume Lagarec | 2022-10-04 |
| 11366074 | Method for cross-section sample preparation | Ken Guillaume Lagarec, Andrew John Murray | 2022-06-21 |
| 10886100 | Method and system for cross-sectioning a sample with a preset thickness or to a target site | Ken Guillaume Lagarec | 2021-01-05 |
| 10586680 | Microscopy imaging method and system | Ken Guillaume Lagarec | 2020-03-10 |
| 9915628 | Circuit tracing using a focused ion beam | Christopher Pawlowicz, Alexander Sorkin, Alexander Krechmer, Ken Guillaume Lagarec | 2018-03-13 |
| 9812290 | Microscopy imaging method and system | Ken Guillaume Lagarec | 2017-11-07 |
| 9633819 | Microscopy imaging method and system | Ken Guillaume Lagarec | 2017-04-25 |
| 9383327 | Circuit tracing using a focused ion beam | Chris Pawlowicz, Alexander Sorkin, Alexander Krechmer, Ken Guillaume Lagarec | 2016-07-05 |
| 8791436 | Circuit tracing using a focused ion beam | Chris Pawlowicz, Alexander Sorkin, Alexander Krechmer, Ken Guillaume Lagarec | 2014-07-29 |
| 8552406 | Apparatus and method for surface modification using charged particle beams | Ken Guillaume Lagarec, Alexander Krechmer | 2013-10-08 |
| 8466415 | Methods for performing circuit edit operations with low landing energy electron beams | Ken Guillaume Lagarec, Alexander Krechmer | 2013-06-18 |
| 8093567 | Method and system for counting secondary particles | Ken Guillaume Lagarec | 2012-01-10 |
| 7897918 | System and method for focused ion beam data analysis | Michael A. Anderson, Ken Guillaume Lagarec | 2011-03-01 |
| 7893397 | Apparatus and method for surface modification using charged particle beams | Ken Guillaume Lagarec, Alexander Krechmer | 2011-02-22 |
| 7535000 | Method and system for identifying events in FIB | Ken Guillaume Lagarec | 2009-05-19 |
| 6684379 | Design analysis workstation for analyzing integrated circuits | David F. Skoll, Terry Ludlow, Julia Elvidge | 2004-01-27 |
| 6641705 | Apparatus and method for reducing differential sputter rates | Jian Li, Richard F. Shuman, Kathryn Noll, J. David Casey, Jr. | 2003-11-04 |
| 6453063 | Automatic focused ion beam imaging system and method | Dick James, Julia Elvidge, Pierrette M. Breton, Terry Ludlow, David F. Skoll +3 more | 2002-09-17 |
| 6288393 | Automated method of circuit analysis | Dick James, Pierrette M. Breton, Julia Elvidge, Ray Haythornthwaite | 2001-09-11 |