| 12288664 |
Particle beam device having a deflection unit |
Dirk Preikszas |
2025-04-29 |
| 12255044 |
Fiducial guided cross-sectioning and lamella preparation with tomographic data collection |
Ken Guillaume Lagarec |
2025-03-18 |
| 12007344 |
Method for cross-section sample preparation |
Ken Guillaume Lagarec, Andrew John Murray |
2024-06-11 |
| RE50001 |
Method and system for cross-sectioning a sample with a preset thickness or to a target site |
Ken Guillaume Lagarec |
2024-06-04 |
| 11923168 |
Microscopy imaging method for 3D tomography with predictive drift tracking for multiple charged particle beams |
Ken Guillaume Lagarec |
2024-03-05 |
| 11726050 |
Method for cross-section sample preparation |
Ken Guillaume Lagarec, Andrew John Murray |
2023-08-15 |
| 11462383 |
Method and system for iteratively cross-sectioning a sample to correlatively targeted sites |
Ken Guillaume Lagarec |
2022-10-04 |
| 11366074 |
Method for cross-section sample preparation |
Ken Guillaume Lagarec, Andrew John Murray |
2022-06-21 |
| 10886100 |
Method and system for cross-sectioning a sample with a preset thickness or to a target site |
Ken Guillaume Lagarec |
2021-01-05 |
| 10586680 |
Microscopy imaging method and system |
Ken Guillaume Lagarec |
2020-03-10 |
| 9915628 |
Circuit tracing using a focused ion beam |
Christopher Pawlowicz, Alexander Sorkin, Alexander Krechmer, Ken Guillaume Lagarec |
2018-03-13 |
| 9812290 |
Microscopy imaging method and system |
Ken Guillaume Lagarec |
2017-11-07 |
| 9633819 |
Microscopy imaging method and system |
Ken Guillaume Lagarec |
2017-04-25 |
| 9383327 |
Circuit tracing using a focused ion beam |
Chris Pawlowicz, Alexander Sorkin, Alexander Krechmer, Ken Guillaume Lagarec |
2016-07-05 |
| 8791436 |
Circuit tracing using a focused ion beam |
Chris Pawlowicz, Alexander Sorkin, Alexander Krechmer, Ken Guillaume Lagarec |
2014-07-29 |
| 8552406 |
Apparatus and method for surface modification using charged particle beams |
Ken Guillaume Lagarec, Alexander Krechmer |
2013-10-08 |
| 8466415 |
Methods for performing circuit edit operations with low landing energy electron beams |
Ken Guillaume Lagarec, Alexander Krechmer |
2013-06-18 |
| 8093567 |
Method and system for counting secondary particles |
Ken Guillaume Lagarec |
2012-01-10 |
| 7897918 |
System and method for focused ion beam data analysis |
Michael A. Anderson, Ken Guillaume Lagarec |
2011-03-01 |
| 7893397 |
Apparatus and method for surface modification using charged particle beams |
Ken Guillaume Lagarec, Alexander Krechmer |
2011-02-22 |
| 7535000 |
Method and system for identifying events in FIB |
Ken Guillaume Lagarec |
2009-05-19 |
| 6684379 |
Design analysis workstation for analyzing integrated circuits |
David F. Skoll, Terry Ludlow, Julia Elvidge |
2004-01-27 |
| 6641705 |
Apparatus and method for reducing differential sputter rates |
Jian Li, Richard F. Shuman, Kathryn Noll, J. David Casey, Jr. |
2003-11-04 |
| 6453063 |
Automatic focused ion beam imaging system and method |
Dick James, Julia Elvidge, Pierrette M. Breton, Terry Ludlow, David F. Skoll +3 more |
2002-09-17 |
| 6288393 |
Automated method of circuit analysis |
Dick James, Pierrette M. Breton, Julia Elvidge, Ray Haythornthwaite |
2001-09-11 |