Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12255044 | Fiducial guided cross-sectioning and lamella preparation with tomographic data collection | Michael William Phaneuf | 2025-03-18 |
| 12007344 | Method for cross-section sample preparation | Michael William Phaneuf, Andrew John Murray | 2024-06-11 |
| RE50001 | Method and system for cross-sectioning a sample with a preset thickness or to a target site | Michael William Phaneuf | 2024-06-04 |
| 11923168 | Microscopy imaging method for 3D tomography with predictive drift tracking for multiple charged particle beams | Michael William Phaneuf | 2024-03-05 |
| 11726050 | Method for cross-section sample preparation | Michael William Phaneuf, Andrew John Murray | 2023-08-15 |
| 11462383 | Method and system for iteratively cross-sectioning a sample to correlatively targeted sites | Michael William Phaneuf | 2022-10-04 |
| 11366074 | Method for cross-section sample preparation | Michael William Phaneuf, Andrew John Murray | 2022-06-21 |
| 10886100 | Method and system for cross-sectioning a sample with a preset thickness or to a target site | Michael William Phaneuf | 2021-01-05 |
| 10586680 | Microscopy imaging method and system | Michael William Phaneuf | 2020-03-10 |
| 9915628 | Circuit tracing using a focused ion beam | Christopher Pawlowicz, Alexander Sorkin, Michael William Phaneuf, Alexander Krechmer | 2018-03-13 |
| 9812290 | Microscopy imaging method and system | Michael William Phaneuf | 2017-11-07 |
| 9633819 | Microscopy imaging method and system | Michael William Phaneuf | 2017-04-25 |
| 9383327 | Circuit tracing using a focused ion beam | Chris Pawlowicz, Alexander Sorkin, Michael William Phaneuf, Alexander Krechmer | 2016-07-05 |
| 8791436 | Circuit tracing using a focused ion beam | Chris Pawlowicz, Alexander Sorkin, Michael William Phaneuf, Alexander Krechmer | 2014-07-29 |
| 8552406 | Apparatus and method for surface modification using charged particle beams | Michael William Phaneuf, Alexander Krechmer | 2013-10-08 |
| 8466415 | Methods for performing circuit edit operations with low landing energy electron beams | Michael William Phaneuf, Alexander Krechmer | 2013-06-18 |
| 8093567 | Method and system for counting secondary particles | Michael William Phaneuf | 2012-01-10 |
| 7897918 | System and method for focused ion beam data analysis | Michael William Phaneuf, Michael A. Anderson | 2011-03-01 |
| 7893397 | Apparatus and method for surface modification using charged particle beams | Michael William Phaneuf, Alexander Krechmer | 2011-02-22 |
| 7535000 | Method and system for identifying events in FIB | Michael William Phaneuf | 2009-05-19 |