Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12308233 | Dual critical dimension patterning | Kuo-Chang Kau, Chia-Chu Liu, Hua-Tai Lin | 2025-05-20 |
| 12183633 | Dielectric cap structure in semiconductor devices and methods of manufacturing the same | Te-Chih Hsiung, Yi-Chen Wang, Guang-Hong Cheng, Yuan-Tien Tu, Huan-Just Lin | 2024-12-31 |
| 11854854 | Method for calibrating alignment of wafer and lithography system | Chang-Jen Chen, Yen-Chun Chen, Po-Ting Yeh | 2023-12-26 |
| 11392045 | Method for manufacturing semiconductor device and system for performing the same | Hua-Tai Lin, Chia-Chu Liu | 2022-07-19 |
| 10859924 | Method for manufacturing semiconductor device and system for performing the same | Hua-Tai Lin, Chia-Chu Liu | 2020-12-08 |
| 9728469 | Methods for forming a stress-relieved film stack by applying cutting patterns | Ching-Yu Chang | 2017-08-08 |
| 9436086 | Anti-reflective layer and method | Yu-Chung Su, Ching-Yu Chang | 2016-09-06 |
| 9349622 | Method and apparatus for planarization of substrate coatings | Cheng-Han Wu, Yu-Chung Su, Ching-Yu Chang | 2016-05-24 |
| 9245751 | Anti-reflective layer and method | Yu-Chung Su, Ching-Yu Chang | 2016-01-26 |
| 9239520 | Photoresist defect reduction system and method | Ching-Yu Chang | 2016-01-19 |
| 9110376 | Photoresist system and method | Cheng-Han Wu | 2015-08-18 |
| 9017934 | Photoresist defect reduction system and method | Ching-Yu Chang | 2015-04-28 |
| 7723763 | Color photodetector apparatus with multi-primary pixels | Hsuen-Li Chen, Kuan-Sheng Lai | 2010-05-25 |