Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11854854 | Method for calibrating alignment of wafer and lithography system | Wen-Yun Wang, Yen-Chun Chen, Po-Ting Yeh | 2023-12-26 |
CC
Chang-Jen Chen
Overall (All Time): #2,629,354 of 4,157,543Top 65%
1
Patents All Time