TL

Tsung Chuan Lee

TSMC: 18 patents #1,811 of 12,232Top 15%
Overall (All Time): #244,153 of 4,157,543Top 6%
18
Patents All Time

Issued Patents All Time

Showing 1–18 of 18 patents

Patent #TitleCo-InventorsDate
12216399 Method of manufacturing semiconductor device Chih-Tsung Shih, Tsung-Chih Chien, Hao-Shiang Chang 2025-02-04
12181791 Extreme ultraviolet mask and method of manufacturing the same Chih-Tsung Shih, Tsung-Chih Chien, Shih-Chi Fu, Chi-Hua FU, Kuotang CHENG +1 more 2024-12-31
12072633 Extreme ultraviolet lithography method, extreme ultraviolet mask and formation method thereof Chih-Tsung Shih, Yu-Hsun Wu, Bo-Tsun Liu 2024-08-27
12066765 Operating method for preventing photomask particulate contamination Jui-Chieh Chen, Tsung-Chih Chien, Chih-Tsung Shih 2024-08-20
12013641 Method of reducing undesired light influence in extreme ultraviolet exposure Chih-Tsung Shih, Chen-Ming Wang, Yahru Cheng, Bo-Tsun Liu 2024-06-18
11940727 Reticle enclosure for lithography systems Chih-Tsung Shih, Tsung-Chih Chien, Hao-Shiang Chang 2024-03-26
11774844 Extreme ultraviolet mask and method of manufacturing the same Chih-Tsung Shih, Tsung-Chih Chien, Shih-Chi Fu, Chi-Hua FU, Kuotang CHENG +1 more 2023-10-03
11720025 Extreme ultraviolet lithography method, extreme ultraviolet mask and formation method thereof Chih-Tsung Shih, Yu-Hsun Wu, Bo-Tsun Liu 2023-08-08
11703762 Method of reducing undesired light influence in extreme ultraviolet exposure Chih-Tsung Shih, Chen-Ming Wang, Yahru Cheng, Bo-Tsun Liu 2023-07-18
11614683 Reticle enclosure for lithography systems Chih-Tsung Shih, Tsung-Chih Chien, Hao-Shiang Chang 2023-03-28
11506985 Semiconductor apparatus and method of operating the same for preventing photomask particulate contamination Jui-Chieh Chen, Tsung-Chih Chien, Chih-Tsung Shih 2022-11-22
11415879 Reticle enclosure for lithography systems Chih-Tsung Shih, Tsung-Chih Chien, Hao-Shiang Chang 2022-08-16
11392022 Extreme ultraviolet lithography method, extreme ultraviolet mask and formation method thereof Chih-Tsung Shih, Yu-Hsun Wu, Bo-Tsun Liu 2022-07-19
11275301 Extreme ultraviolet mask and method of manufacturing the same Chih-Tsung Shih, Tsung-Chih Chien, Shih-Chi Fu, Chi-Hua FU, Kuotang CHENG +1 more 2022-03-15
11119420 Particle prevention method in lithography exposure apparatus Yi-Wei Lee, Jui-Chieh Chen, Chih-Tsung Shih 2021-09-14
10976674 Method for detecting EUV pellicle rupture Chih-Tsung Shih, Bo-Tsun Liu 2021-04-13
10824080 Method to reduce native defect printability Chih-Tsung Shih, Tsung-Chih Chien 2020-11-03
9625822 Mechanisms for performing a photolithography process with a surface modifying treatment on an exposed photoresist layer Chi-Cheng Tsai, Hung-Chi Wu, Chung-Hsien Lin 2017-04-18