Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11226363 | Reliability testing method and apparatus | Liang-Chen Lin, Chia-Wei Tu | 2022-01-18 |
| 10847492 | Semiconductor structure and manufacturing method for the same | Jyun-Lin Wu, Liang-Chen Lin | 2020-11-24 |
| 10495687 | Reliability testing method | Liang-Chen Lin, Chia-Wei Tu | 2019-12-03 |
| 9508617 | Test chip, test board and reliability testing method | Liang-Chen Lin, Chia-Wei Tu | 2016-11-29 |