Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12159809 | System and method for measuring device inside through-silicon via surroundings | Shuo-Wen Chang, Yu-Hsien Li, Yuan-Yao Chang | 2024-12-03 |
| 11955392 | System and method for measuring device inside through-silicon via surroundings | Shuo-Wen Chang, Yu-Hsien Li, Yuan-Yao Chang | 2024-04-09 |
| 11211318 | Bump layout for coplanarity improvement | Ling Li, Cheng-Lin Huang, Fu-Kang Chiao, Matt Chou, Chun-Yen Lo +3 more | 2021-12-28 |
| 9086450 | Method for measuring capacitances of capacitors | Chih-Chiang Chang, Chu Fu Chen, Ping Huang | 2015-07-21 |
| 8779796 | Method and apparatus for device parameter measurement | Tseng Chin Luo, Chu Fu Chen, Yuan-Yao Chang | 2014-07-15 |