Issued Patents All Time
Showing 26–50 of 97 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11120308 | Vehicle damage detection method based on image analysis, electronic device and storage medium | Hao Zhang, Ruei-Sung Lin, Mei Han | 2021-09-14 |
| 11107923 | Source/drain regions of FinFET devices and methods of forming same | Heng-Wen Ting, Yen-Ru Lee, Hsueh-Chang Sung | 2021-08-31 |
| 11075120 | FinFET device and method | Heng-Wen Ting, Hsueh-Chang Sung, Yen-Ru Lee, Chien-Wei Lee | 2021-07-27 |
| 10963715 | Device and method for biometric recognition and method for registering biometric template | Dong Xu, Lei Fan, Jinfang Zhang | 2021-03-30 |
| 10956549 | Device and method for biometric recognition, and biometric template registration method | Dong Xu, Lei Fan, Jinfang Zhang | 2021-03-23 |
| 10950725 | Epitaxial source/drain structure and method of forming same | Hsueh-Chang Sung | 2021-03-16 |
| 10916656 | MOS devices having epitaxy regions with reduced facets | Hsueh-Chang Sung, Tze-Liang Lee, Chii-Horng Li, Tsz-Mei Kwok | 2021-02-09 |
| 10909945 | Method and apparatus for pixel drive control, display panel and storage medium | Jie Cao, Yueyuan Zhang, Hui Sun | 2021-02-02 |
| 10879355 | Profile design for improved device performance | Yen-Ru Lee, Hsueh-Chang Sung | 2020-12-29 |
| 10868181 | Semiconductor structure with blocking layer and method for forming the same | Wei-Yang Lee, Wen-Chu Hsiao | 2020-12-15 |
| 10861971 | Doping profile for strained source/drain region | Hsueh-Chang Sung, Tsz-Mei Kwok, Tze-Liang Lee, Chii-Horng Li | 2020-12-08 |
| 10797173 | MOS devices with non-uniform p-type impurity profile | Hsueh-Chang Sung, Tsz-Mei Kwok, Tze-Liang Lee, Chii-Horng Li | 2020-10-06 |
| 10747075 | Discharge circuit, discharge method and display device | Dayu Zhang | 2020-08-18 |
| 10749029 | Semiconductor device and manufacturing method thereof | Tsz-Mei Kwok, Ming-Hua Yu, Chan-Lon Yang | 2020-08-18 |
| 10734520 | MOS devices having epitaxy regions with reduced facets | Hsueh-Chang Sung, Tze-Liang Lee, Chii-Horng Li, Tsz-Mei Kwok | 2020-08-04 |
| 10727131 | Source and drain epitaxy re-shaping | Chih-Chiang Chang, Wen-Chu Hsiao, Che-Yu Lin, Wei Yang | 2020-07-28 |
| 10727342 | Source and drain stressors with recessed top surfaces | Tsz-Mei Kwok, Hsueh-Chang Sung, Chii-Horng Li, Tze-Liang Lee | 2020-07-28 |
| 10714487 | Semiconductor device and manufacturing method of a semiconductor device | Yi-Jing Lee, Tsz-Mei Kwok, Ming-Hua Yu | 2020-07-14 |
| 10707328 | Method of forming epitaxial fin structures of finFET | Hsueh-Chang Sung | 2020-07-07 |
| 10616997 | Circuit board structure, binding test method and display device | Tao Ma, Fengzhen Lv | 2020-04-07 |
| 10571512 | Test device for printed circuit board assembly | Yueyuan Zhang, Shancai Zhang, Yifei Zhan, Chengcheng Hou, Guanglei Yang +2 more | 2020-02-25 |
| 10546547 | Device for adjusting common electrode voltage by detecting common electrode voltage to change polarity inversion signal and method thereof, driving circuit and display device | — | 2020-01-28 |
| 10510753 | Integrated circuit and manufacturing method thereof | Yi-Jing Lee, Ming-Hua Yu, Tsz-Mei Kwok | 2019-12-17 |
| 10475926 | MOS devices having epitaxy regions with reduced facets | Hsueh-Chang Sung, Tze-Liang Lee, Chii-Horng Li, Tsz-Mei Kwok | 2019-11-12 |
| 10297690 | Method of forming a contact structure for a FinFET semiconductor device | Liang Chen, Wen-Chu Hsiao | 2019-05-21 |